Prof. Krzysztof Patorski Profile

Prof. Krzysztof Patorski

Professor at Warsaw Univ of Technology

SPIE Involvement:

Publications (56)

PROCEEDINGS ARTICLE | December 23, 2016

Adaptive automatic data analysis in full-field fringe-pattern-based optical metrology

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Fringe analysis, Modulation, Spatial frequencies, Denoising, Phase shift keying, Demodulation, Optical testing, Signal processing, Amplitude modulation, Data analysis

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PROCEEDINGS ARTICLE | December 23, 2016

Surface flatness measurement of quasi-parallel plates employing three-beam interference with strong reference beam

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Photovoltaics, Beam splitters, Fringe analysis, Phase shifting, Interferometers, Fourier transforms, Interferometry, Optical testing, Phase retrieval, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | December 23, 2016

Coplanar three-beam interference and phase edge dislocations

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Diffraction, Fringe analysis, Edge detection, Modulation, Wavelets, Phase shift keying, Image filtering, Spiral phase plates, Continuous wavelet transforms, Diffraction gratings

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PROCEEDINGS ARTICLE | August 28, 2016

Single and two-shot quantitative phase imaging using Hilbert-Huang Transform based fringe pattern analysis

Proc. SPIE. 9960, Interferometry XVIII

KEYWORDS: Fringe analysis, Phase shifting, Principal component analysis, Digital holography, Blood, Fourier transforms, Fourier transforms, Demodulation, Phase retrieval, Phase imaging, Phase shifts

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PROCEEDINGS ARTICLE | April 26, 2016

Evaluation of single-shot and two-shot fringe pattern phase demodulation algorithms aided by the Hilbert-Huang transform

Proc. SPIE. 9890, Optical Micro- and Nanometrology VI

KEYWORDS: Fringe analysis, Holography, Principal component analysis, Image processing, Digital filtering, Error analysis, Interferometry, Phase shift keying, Demodulation, Computer simulations, Optical metrology, Reconstruction algorithms, Algorithm development, Signal analyzers, Phase shifts

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PROCEEDINGS ARTICLE | September 11, 2015

Three-beam interferogram analysis method for surface flatness testing of glass plates and wedges

Proc. SPIE. 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015

KEYWORDS: Fringe analysis, Reflection, Interferometers, Glasses, Wavelets, Interferometry, Computer simulations, Phase retrieval, Photonics, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | December 5, 2014

Optical sectioning microscopy using two-frame structured illumination and Hilbert-Huang data processing

Proc. SPIE. 9441, 19th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Modulation, Spatial frequencies, Microscopy, Phase shift keying, Linear filtering, Demodulation, Data processing, Reconstruction algorithms, Phase shifts, Bandpass filters

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We propose a fast, simple and experimentally robust method for reconstructing background-rejected optically-sectioned microscopic images using two-shot structured illumination approach. Innovative data demodulation technique requires two grid-illumination images mutually phase shifted by π (half a grid period) but precise phase displacement value is not critical. Upon subtraction of the two frames the input pattern with increased grid modulation is computed. The proposed demodulation procedure comprises: (1) two-dimensional data processing based on the enhanced, fast empirical mode decomposition (EFEMD) method for the object spatial frequency selection (noise reduction and bias term removal), and (2) calculating high contrast optically-sectioned image using the two-dimensional spiral Hilbert transform (HS). The proposed algorithm effectiveness is compared with the results obtained for the same input data using conventional structured-illumination (SIM) and HiLo microscopy methods. The input data were collected for studying highly scattering tissue samples in reflectance mode. In comparison with the conventional three-frame SIM technique we need one frame less and no stringent requirement on the exact phase-shift between recorded frames is imposed. The HiLo algorithm outcome is strongly dependent on the set of parameters chosen manually by the operator (cut-off frequencies for low-pass and high-pass filtering and η parameter value for optically-sectioned image reconstruction) whereas the proposed method is parameter-free. Moreover very short processing time required to efficiently demodulate the input pattern predestines proposed method for real-time in-vivo studies. Current implementation completes full processing in 0.25s using medium class PC (Inter i7 2,1 GHz processor and 8 GB RAM). Simple modification employed to extract only first two BIMFs with fixed filter window size results in reducing the computing time to 0.11s (8 frames/s).

PROCEEDINGS ARTICLE | December 5, 2014

Wavelet transform in fringe separation

Proc. SPIE. 9441, 19th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Fringe analysis, Wavelet transforms, Spatial frequencies, Wavelets, Reliability, Fourier transforms, Numerical simulations, Phase shift keying, Image analysis, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | December 5, 2014

Evaluation of optical parameters of quasi-parallel plates with single-frame interferogram analysis methods and eliminating the influence of camera parasitic fringes

Proc. SPIE. 9441, 19th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Photovoltaics, Fringe analysis, Phase shifting, Interferometers, Cameras, Glasses, Image processing, Wavelets, Interferometry, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | December 5, 2014

Evaluation of the implicit smoothing splines algorithm for the interferometric fringe pattern phase retrieval

Proc. SPIE. 9441, 19th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Signal to noise ratio, Fringe analysis, Denoising, Complex systems, Fourier transforms, Interferometry, Demodulation, Phase retrieval, Smoothing, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | August 18, 2014

Wavelet transform: capabilities expanded

Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis

KEYWORDS: Diffraction, Fringe analysis, Wavelet transforms, Modulation, Interferometers, Wavelets, Interferometry, Ronchi rulings, Continuous wavelet transforms, Diffraction gratings

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PROCEEDINGS ARTICLE | August 18, 2014

Hilbert-Huang processing and analysis of complex fringe patterns

Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis

KEYWORDS: Fringe analysis, Modulation, Digital filtering, Denoising, Interferometry, Phase shift keying, Demodulation, Signal processing, Reconstruction algorithms, Amplitude modulation

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PROCEEDINGS ARTICLE | May 1, 2014

Single-shot two-channel Talbot interferometry using checker grating and Hilbert-Huang fringe pattern processing

Proc. SPIE. 9132, Optical Micro- and Nanometrology V

KEYWORDS: Diffraction, Fringe analysis, Interferometers, Digital filtering, Ions, Interferometry, Wavefronts, Ear, Binary data, Diffraction gratings

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PROCEEDINGS ARTICLE | December 17, 2013

Denoising and extracting background from fringe patterns using midpoint-based bidimensional empirical mode decomposition

Proc. SPIE. 9066, Eleventh International Conference on Correlation Optics

KEYWORDS: Fringe analysis, Statistical analysis, Image processing, Denoising, Interferometry, Demodulation, Speckle pattern, Signal processing, Filtering (signal processing), Evolutionary algorithms

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PROCEEDINGS ARTICLE | December 7, 2013

Nanocrystallic thin films statistical structural analysis by the automatic image processing

Proc. SPIE. 8923, Micro/Nano Materials, Devices, and Systems

KEYWORDS: Thin films, Diffraction, Fringe analysis, Statistical analysis, Modulation, Image segmentation, Image processing, Electron microscopes, Structural analysis, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | December 18, 2012

Space domain interpretation of incoherent moiré superimpositions using FABEMD

Proc. SPIE. 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Fringe analysis, Modulation, Spatial frequencies, Sensors, Image processing, Digital filtering, Linear filtering, Signal processing, Image filtering, Binary data

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PROCEEDINGS ARTICLE | December 18, 2012

Continuous wavelet transform processing of fringe patterns containing multiple fringe sets

Proc. SPIE. 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Fringe analysis, Modulation, Spatial frequencies, Image processing, Wavelets, Reliability, Phase shift keying, Computer simulations, Image analysis, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | November 1, 2012

Continuous wavelet transform for d-space distribution analysis in nanocrystallic materials

Proc. SPIE. 8411, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI

KEYWORDS: Thin films, Diffraction, Fringe analysis, Statistical analysis, Image segmentation, Image processing, Wavelets, Crystals, Image resolution, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | November 23, 2011

Information retrieval from amplitude modulated fringe patterns using single frame processing methods

Proc. SPIE. 8338, Tenth International Conference on Correlation Optics

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Spatial frequencies, Wavelets, Interferometry, Phase shift keying, Demodulation, Signal analyzers, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | December 15, 2010

Application of the S-transform to the phase-shift extraction in phase shifting interferometry

Proc. SPIE. 7746, 17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Phase shifting, Modulation, Calibration, Fourier transforms, Interferometry, Phase shift keying, Computer simulations, Phase interferometry, Algorithm development, Phase shifts

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PROCEEDINGS ARTICLE | December 15, 2010

Continuous wavelet transform analysis and visualization of additive type moire and time-average fringe patterns

Proc. SPIE. 7746, 17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Superposition, Fringe analysis, Visual analytics, Modulation, Visualization, Spatial frequencies, Wavelets, Interferometry, Phase shift keying, Continuous wavelet transforms

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PROCEEDINGS ARTICLE | November 20, 2008

Quasi-parallel glass plate measurements using Fizeau interferometer

Proc. SPIE. 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Fringe analysis, Phase shifting, Atrial fibrillation, Modulation, Glasses, Interferometry, Phase shift keying, Optical testing, Mendelevium, Fizeau interferometers

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PROCEEDINGS ARTICLE | November 20, 2008

Comparative analysis of the interferogram noise filtration using wavelet transform and spin filtering algorithms

Proc. SPIE. 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Fringe analysis, Wavelet transforms, Denoising, Error analysis, Interferometry, Distortion, Discrete wavelet transforms, Electronic filtering, Current controlled current source

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PROCEEDINGS ARTICLE | August 11, 2008

Fizeau interferometer for quasi parallel optical plate testing

Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis

KEYWORDS: Refractive index, Fringe analysis, Phase shifting, Atrial fibrillation, Modulation, Interferometry, Phase shift keying, Optical testing, Phase shifts, Fizeau interferometers

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PROCEEDINGS ARTICLE | June 18, 2007

Derivation of quasi-parallel glass plate parameters tested in a Fizeau interferometer

Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Interferometers, Glasses, Interferometry, Phase shift keying, Mendelevium, Phase shifts, Fizeau interferometers

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PROCEEDINGS ARTICLE | October 12, 2006

Automatic analysis of interferograms: the issue of phase shifter calibration

Proc. SPIE. 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006

KEYWORDS: Phase shifting, Ferroelectric materials, Modulation, Calibration, Interferometry, Data acquisition, Numerical analysis, Phase measurement, Algorithm development, Phase shifts

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PROCEEDINGS ARTICLE | August 14, 2006

Detection and assessment of the nonuniform phase displacement error in temporal phase shifting interferometry

Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis

KEYWORDS: Ferroelectric materials, Detection and tracking algorithms, Modulation, Interferometers, Sensors, Calibration, Phase shift keying, Phase interferometry, Double patterning technology, Phase shifts

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PROCEEDINGS ARTICLE | August 14, 2006

Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination

Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Error analysis, Interferometry, Numerical simulations, Phase shift keying, Data processing, Bessel functions, Phase shifts

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SPIE Journal Paper | August 1, 2006

Interferogram intensity modulation calculations using temporal phase shifting: error analysis

Patorski, Krzysztof , Styk, Adam

OE Vol. 45 Issue 08

KEYWORDS: Modulation, Phase shift keying, Error analysis, Solids, Phase shifts, Optical engineering, Computer simulations, Fringe analysis, Visualization, Phase shifting

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PROCEEDINGS ARTICLE | April 20, 2006

Time-average interference microscopy for vibration testing of silicon microelements

Proc. SPIE. 6158, Lightmetry and Light and Optics in Biomedicine 2004

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Visualization, Microscopy, Error analysis, Silicon, Interferometry, Phase shift keying, Bessel functions

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PROCEEDINGS ARTICLE | October 12, 2005

Theory and practice of two-beam interferogram modulation determination

Proc. SPIE. 5958, Lasers and Applications

KEYWORDS: Phase shifting, Modulation, Visualization, Error analysis, Numerical simulations, Phase shift keying, Computer simulations, Solids, Charge-coupled devices, Phase shifts

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PROCEEDINGS ARTICLE | June 13, 2005

Interferogram intensity modulation calculations using temporal phase shifting: error analysis

Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Visualization, Error analysis, Silicon, Phase shift keying, Solids, Charge-coupled devices, Phase shifts

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SPIE Journal Paper | June 1, 2005

Phase-shifting method contrast calculations in time-averaged interferometry: error analysis

Patorski, Krzysztof , Sienicki, Zbigniew , Styk, Adam

OE Vol. 44 Issue 06

KEYWORDS: Modulation, Phase shift keying, Phase shifts, Error analysis, Solids, Optical engineering, Fringe analysis, Silicon, Bessel functions, Visualization

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PROCEEDINGS ARTICLE | September 8, 2004

Conventional and fiber optics interferometry for vibration mode analysis

Proc. SPIE. 5576, Lightguides and their Applications II

KEYWORDS: Ferroelectric materials, Modulation, Fiber optics, Interferometers, Interferometry, Phase shift keying, Semiconductor lasers, Speckle pattern, Heterodyning, Bessel functions

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PROCEEDINGS ARTICLE | August 17, 2004

Studies of the properties of the temporal phase-shifting method applied to silicone microelement vibration investigations using the time-average method

Proc. SPIE. 5458, Optical Micro- and Nanometrology in Manufacturing Technology

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Visualization, Error analysis, Silicon, Phase shift keying, Solids, Bessel functions, Phase shifts

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SPIE Journal Paper | February 1, 2004

Simple polarization phase-stepping scatterplate interferometry

Patorski, Krzysztof , Salbut, Leszek

OE Vol. 43 Issue 02

KEYWORDS: Polarization, Interferometers, Mirrors, Fringe analysis, Interferometry, Phase shifting, Phase shifts, Phase interferometry, Modulation, Optical testing

PROCEEDINGS ARTICLE | October 6, 2003

Interferometric measurements of the vibration of a silicon microbeam/cantilever unit used in atomic force microscopy (AFM)

Proc. SPIE. 5229, Laser Technology VII: Applications of Lasers

KEYWORDS: Microelectromechanical systems, Mirrors, Visualization, Sensors, Silicon, Interferometry, Atomic force microscopy, Vibrometry, Microopto electromechanical systems, Atomic force microscope

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PROCEEDINGS ARTICLE | October 6, 2003

Application of lasers in precise measurements of microelements

Proc. SPIE. 5229, Laser Technology VII: Applications of Lasers

KEYWORDS: Microelectromechanical systems, Refractive index, Beam splitters, Digital holography, Waveguides, Interferometers, Interferometry, Tomography, Heterodyning, Microopto electromechanical systems

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PROCEEDINGS ARTICLE | October 3, 2003

Active microelement testing by interferometry using time-average and quasi-stroboscopic techniques

Proc. SPIE. 5145, Microsystems Engineering: Metrology and Inspection III

KEYWORDS: Ferroelectric materials, Digital holography, Modulation, Visualization, Calibration, Electrodes, Interferometry, Optical testing, Spatial resolution, Bessel functions

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PROCEEDINGS ARTICLE | May 30, 2003

Simple polarization phase shifting for scatterplate interferometry

Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III

KEYWORDS: Mirrors, Beam splitters, Fringe analysis, Phase shifting, Modulation, Polarization, Interferometers, Interferometry, Wave plates, Phase shifts

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PROCEEDINGS ARTICLE | May 27, 2003

Simplified time-averaged digital interferometry for vibration studies of microelements

Proc. SPIE. 4933, Speckle Metrology 2003

KEYWORDS: Visualization, Sensors, Calibration, Video, Interferometry, Atomic force microscopy, Quantitative analysis, Speckle interferometry, Shape analysis, Bessel functions

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PROCEEDINGS ARTICLE | July 11, 2001

Medical applications of the moire and grid projection methods

Proc. SPIE. 4515, Light and Optics in Biomedicine

KEYWORDS: Moire patterns, Medicine, Cornea, Ions, Bone, CCD cameras, Objectives, Relays, Spine, Phase shifts

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PROCEEDINGS ARTICLE | March 7, 2001

Recent developments in electronic speckle pattern interferometry

Proc. SPIE. 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Modulation, Speckle, Interferometers, Image processing, Interferometry, Phase shift keying, Semiconductor lasers, Speckle pattern, Charge-coupled devices, Frame grabbers

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SPIE Conference Volume | August 17, 1999

Interferometry '99: Applications

SPIE Journal Paper | August 1, 1997

Simultaneous registration of in- and out-of-plane displacements in modified grating interferometry

Schmit, Joanna , Patorski, Krzysztof , Creath, Katherine

OE Vol. 36 Issue 08

KEYWORDS: Polarization, Diffraction, Diffraction gratings, Interferometers, Beam splitters, Cameras, Interferometry, Mirrors, Image registration, Prisms

SPIE Journal Paper | July 1, 1997

Digital in-plane electronic speckle pattern shearing interferometry

Patorski, Krzysztof , Olszak, Artur

OE Vol. 36 Issue 07

KEYWORDS: Speckle pattern, Interferometry, Semiconductor lasers, Prisms, Wavefronts, Modulation, Fringe analysis, Interferometers, Phase shifting, Mirrors

PROCEEDINGS ARTICLE | July 17, 1996

Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)

Proc. SPIE. 2860, Laser Interferometry VIII: Techniques and Analysis

KEYWORDS: Prisms, Beam splitters, Fringe analysis, Modulation, Fiber optics, Polarization, Speckle, Interferometry, Semiconductor lasers, Speckle pattern

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PROCEEDINGS ARTICLE | December 1, 1995

Moire and grating projection techniques for measurement of postural deformity

Proc. SPIE. 2646, Digital Photogrammetry and Remote Sensing '95

KEYWORDS: Optical components, Moire patterns, Fringe analysis, X-rays, Computing systems, Distortion, CCD cameras, Shape analysis, Spine, Phase shifts

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PROCEEDINGS ARTICLE | March 30, 1995

Comparative postural deformity studies by photogrammetric methods with structural illumination

Proc. SPIE. 2390, Optical Biophysics

KEYWORDS: Moire patterns, Fringe analysis, X-rays, CCD cameras, 3D metrology, Objectives, Relays, Shape analysis, Spine, Phase shifts

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PROCEEDINGS ARTICLE | December 12, 1994

Computer-aided postural deformity studies using moire and grid projection methods

Proc. SPIE. 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements

KEYWORDS: Optical components, Moire patterns, Fringe analysis, Ions, Computing systems, Image analysis, CCD cameras, Image transmission, Software development, Phase shifts

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SPIE Conference Volume | December 12, 1994

Interferometry '94: New Techniques and Analysis in Optical Measurements

PROCEEDINGS ARTICLE | December 12, 1994

Furniture ergonomics studies by the projection moire method

Proc. SPIE. 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements

KEYWORDS: Optical components, Moire patterns, Imaging systems, Video, Ions, Bone, Distance measurement, Shape analysis, Physiology, Samarium

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PROCEEDINGS ARTICLE | November 30, 1994

Selected full-field optical techniques in experimental mechanics: precision and complexity

Proc. SPIE. 2342, Interferometry '94: Photomechanics

KEYWORDS: Moire patterns, Fringe analysis, Photoelasticity, Polarization, Interferometers, Composites, Coating, Interferometry, Experimental mechanics, Diffraction gratings

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PROCEEDINGS ARTICLE | August 1, 1992

Applications of moire techniques in biomedicine (Proceedings Only)

Proc. SPIE. 1647, Holography, Interferometry, and Optical Pattern Recognition in Biomedicine II

KEYWORDS: Moire patterns, Fringe analysis, Imaging systems, Ions, CCD cameras, 3D metrology, Shape analysis, Optical engineering, Acquisition tracking and pointing, Phase shifts

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SPIE Journal Paper | March 1, 1992

Polarization approach to high-sensitivity moire interferometry

Salbut, Leszek , Patorski, Krzysztof , Kujawinska, Malgorzata

OE Vol. 31 Issue 03

KEYWORDS: Polarization, Phase shifts, Deflectometry, Error analysis, Diffraction gratings, Diffraction, Picosecond phenomena, Moire patterns, Fringe analysis, Aluminum

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PROCEEDINGS ARTICLE | December 1, 1991

Polarization approach to high-sensitivity moire interferometry

Proc. SPIE. 1554, Second International Conference on Photomechanics and Speckle Metrology

KEYWORDS: Diffraction, Phase shifting, Polarization, Mechanics, Error analysis, Deflectometry, Picosecond phenomena, Holographic interferometry, Phase shifts, Diffraction gratings

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Showing 5 of 56 publications

Conference Committee Involvement (5)

XIX Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

10 August 2014 | Jelenia Gora, Poland

Medical Imaging

1 September 2005 | Warsaw, Poland

International Conference on Optical Metrology--Interferometry '99: Applications

20 October 1999 | Pultusk Castle, Poland

International Conference on Optical Metrology

20 October 1999 | Pultusk Castle, Poland

Interferometry '94: New Techniques and Analysis in Optical Measurements

16 May 1994 | Warsaw, Poland

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