Prof. Kuk Won Ko Profile

Prof. Kuk Won Ko

at Sun Moon Univ

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 25 October 2004 Paper

Development of automatic inspection of defect of compact camera module

Kuk Won Ko, Yu Jin Lee, Beong Wuk Choi, Kyoung Cheol Koh, Jong Hyeong Kim

Proceedings Volume 5603, (2004) https://doi.org/10.1117/12.577570

KEYWORDS: Inspection, CMOS sensors, Algorithm development, Image sensors, Defect inspection, Cameras, Image processing, Defect detection, Calibration, Detection and tracking algorithms

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Proceedings Article | 25 October 2004 Paper

An automatic inspection of SMT rectangular chips based on PCA algorithm

Kyung Cheol Koh, Kuk Won Ko, Byoung-Wook Choi, Jong Hyeong Kim, Hyung Suck Cho

Proceedings Volume 5603, (2004) https://doi.org/10.1117/12.573592

KEYWORDS: Inspection, Principal component analysis, Calibration, Image processing, Statistical analysis, Optical inspection, Optical character recognition, Manufacturing, Reliability, Detection and tracking algorithms

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Proceedings Article | 12 February 2001 Paper

Sensor-based navigation of air duct inspection mobile robots

Kyoungchul Koh, H.J. Choi, Jae-Seon Kim, Kuk Won Ko, Hyungsuck Cho

Proceedings Volume 4190, (2001) https://doi.org/10.1117/12.417227

KEYWORDS: Cameras, Mobile robots, Sensors, 3D image processing, Inspection, Image sensors, Navigation systems, Image processing, Calibration, CCD cameras

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Proceedings Article | 12 February 2001 Paper

Enhancement of placement accuracy for SMD via development of a new illumination system

Kuk Won Ko, Jae Wan Kim, Hyungsuck Cho, Ki Soo Jin, Kwang Il Koh

Proceedings Volume 4190, (2001) https://doi.org/10.1117/12.417233

KEYWORDS: Lead, Detection and tracking algorithms, Image processing, Algorithm development, Calibration, Inspection, Cameras, Light sources and illumination, Binary data, Hough transforms

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Proceedings Article | 27 August 1999 Paper

Inspection of ball grid array (BGA) solder joints using x-ray cross-sectional images

Young Jun Roh, Kuk Won Ko, Hyungsuck Cho, Hyung Kim, Hyonam Joo, Sung Kim

Proceedings Volume 3836, (1999) https://doi.org/10.1117/12.360270

KEYWORDS: Inspection, X-ray imaging, X-rays, Neural networks, Prototyping, Algorithm development, Neurons, Lead, Bridges, Imaging systems

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