Kun Du
Student at Beihang Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 January 2017
Proc. SPIE. 10322, Seventh International Conference on Electronics and Information Engineering
KEYWORDS: Edge detection, Wavelet transforms, Extremely high frequency, Imaging systems, Stereoscopy, Image segmentation, Image processing, Wavelets, Fast wavelet transforms, Computer security

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