Kun Xu
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Mathematical modeling, Prisms, MATLAB, Error analysis, Wavefronts, Monte Carlo methods, Ray tracing, Autocollimators, Projection systems, Tolerancing

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