Mr. Kuo-Huan Peng
at I-Shou Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 23, 2003
Proc. SPIE. 5343, Reliability, Testing, and Characterization of MEMS/MOEMS III
KEYWORDS: Sensors, Electrons, Silicon, Resistance, Doping, Bridges, Resistors, Transparent conductors, Temperature metrology, Wheatstone bridges

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