Kurt Humphrey
Managing Director/Principal Technologist at IP Enginuity LLC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 March 1995
Proc. SPIE. 2423, Machine Vision Applications in Industrial Inspection III
KEYWORDS: Image processing algorithms and systems, Statistical analysis, Image segmentation, Particles, Optical inspection, Light sources and illumination, Raw materials, Machine vision, Chemical elements, Prototyping

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