Dr. Kyihwan Park
Research Scientist at Gwangju Institute of Science and Technology
SPIE Involvement:
Conference Co-Chair | Author
Publications (11)

PROCEEDINGS ARTICLE | July 1, 2015
Proc. SPIE. 9655, Fifth Asia-Pacific Optical Sensors Conference
KEYWORDS: Mirrors, Digital signal processing, Detection and tracking algorithms, Doppler effect, Laser applications, Computer programming, Vibrometry, Signal processing, Laser Doppler velocimetry, Modal analysis

PROCEEDINGS ARTICLE | July 1, 2015
Proc. SPIE. 9655, Fifth Asia-Pacific Optical Sensors Conference
KEYWORDS: Actuators, Ferroelectric materials, Optical sensors, Sensors, Scanners, Atomic force microscopy, Optical testing, Laser scanners, Image sensors, Atomic force microscope

PROCEEDINGS ARTICLE | July 1, 2015
Proc. SPIE. 9655, Fifth Asia-Pacific Optical Sensors Conference
KEYWORDS: Optical components, Mirrors, Optical design, 3D applications, Modulation, Sensors, Laser scanners, Distance measurement, 3D scanning, Signal detection

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Actuators, Optical sensors, Sensors, Scanners, Error analysis, Atomic force microscopy, Laser scanners, Atomic force microscope, Feedback control, Environmental sensing

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Signal to noise ratio, Switching, Modulation, LIDAR, Interference (communication), Phase shift keying, Semiconductor lasers, Frequency modulation, Distance measurement, Phase measurement

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Modulation, Sensors, Laser range finders, Interference (communication), Phase shift keying, Demodulation, Semiconductor lasers, Signal processing, Distance measurement, Signal detection

Showing 5 of 11 publications
Conference Committee Involvement (1)
Optomechatronic Sensors and Instrumentation II
3 October 2006 | Boston, Massachusetts, United States
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