Kyu Nam Choi
at Seoul National Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | January 18, 2006
Proc. SPIE. 6066, Vision Geometry XIV
KEYWORDS: Visual process modeling, Detection and tracking algorithms, Visualization, Complex systems, Manufacturing, Inspection, Optical inspection, Distance measurement, Computer engineering, Visibility

PROCEEDINGS ARTICLE | April 19, 2004
Proc. SPIE. 5300, Vision Geometry XII
KEYWORDS: Electronics, Defect detection, Image segmentation, Image processing, Digital filtering, Manufacturing, Diagnostics, Distortion, Image filtering, Printed circuit board testing

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