Lalit Mohan Pant
at IRDE
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Photovoltaics, Metrology, Sensors, Error analysis, Manufacturing, Wavefronts, Image registration, Phase measurement, Freeform optics, Data integration

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical design, Metrology, Sensors, Error analysis, Wavefront sensors, Wavefronts, Collimation, Spatial resolution, Algorithm development, Freeform optics

Proceedings Article | 15 June 2015
Proc. SPIE. 9654, International Conference on Optics and Photonics 2015
KEYWORDS: Refractive index, Edge detection, Detection and tracking algorithms, Cameras, Glasses, Zinc, Fourier transforms, Interferometry, Optical testing, Refraction

Proceedings Article | 15 June 2015
Proc. SPIE. 9654, International Conference on Optics and Photonics 2015
KEYWORDS: Polishing, Metrology, Polishing equipment, Optical spheres, Spatial frequencies, Germanium, Interferometry, Aspheric lenses, Spherical lenses, Surface finishing

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