Dr. Laurent Rubaldo
R&D Scientist - Technical Expert at SOFRADIR
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Optoelectronic , Electrical characterization , Electro-optical characterization , Semiconductor Physics , IR Photodetectors , Simulation
Profile Summary

Laurent Rubaldo was born in France, in1975. He received the Ph.D. degree in Physics from the University Joseph Fourier of Grenoble in 2001. He did his Ph.D. at the High Magnetic Field Laboratory of CNRS Grenoble in collaboration with the Institute of Science and Technology of the Manchester University. He studied deep levels in silicon, silicon alloys and III-V materials by Laplace DLTS, combining magnetic field and uniaxial stress to investigate the electronic and structural properties of defects.
He joined STMicroelectronics (Crolles France) in 2001 first as reliability Engineer, to study and modelize new hot carrier mechanisms for submicron CMOS transistors and in 2003 he joined the Front End Material R&D group to develop ultra-doped epitaxial Si and Si alloys by MOCVD. In 2007, he joined the Sofradir Group in the R&D Department, as a Semiconductor Characterization Expert, to work on electro-optical characterization and performances optimization of cooled IR Photodetectors.
Publications (35)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Staring arrays, Mercury cadmium telluride, Sensors, Image processing, Crystals, Manufacturing, Zinc, Image quality, Electro optics

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Staring arrays, Nonuniformity corrections, Indium gallium arsenide, Liquid phase epitaxy, Mercury cadmium telluride, Sensors, Crystals, Image quality, Image sensors, Medium wave

PROCEEDINGS ARTICLE | January 26, 2018
Proc. SPIE. 10540, Quantum Sensing and Nano Electronics and Photonics XV
KEYWORDS: Staring arrays, Nonuniformity corrections, Liquid phase epitaxy, Mercury cadmium telluride, Fluctuations and noise, Sensors, Crystals, Image quality

PROCEEDINGS ARTICLE | May 16, 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Infrared detectors, Defense and security, Long wavelength infrared, Infrared sensors, Mercury cadmium telluride, Quantum IR detectors, Sensors, Quantum efficiency, Modulation transfer functions, Spatial resolution

PROCEEDINGS ARTICLE | January 27, 2017
Proc. SPIE. 10111, Quantum Sensing and Nano Electronics and Photonics XIV
KEYWORDS: Staring arrays, Nonuniformity corrections, Indium gallium arsenide, Mercury cadmium telluride, Sensors, Quantum efficiency, Image quality, Modulation transfer functions, Spatial resolution, Medium wave

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10000, Sensors, Systems, and Next-Generation Satellites XX
KEYWORDS: Readout integrated circuits, Infrared detectors, Signal to noise ratio, Infrared sensors, Mid-IR, Sensors, Retina, Diffusion, Infrared technology, Temperature metrology

Showing 5 of 35 publications
Conference Committee Involvement (2)
Infrared Technology and Applications XLV
14 April 2019 | Baltimore, Maryland, United States
Infrared Technology and Applications XLIV
16 April 2018 | Orlando, Florida, United States
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