Dr. Laurent Rubaldo
Senior Scientist at Lynred
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Optoelectronic , Electrical characterization , Electro-optical characterization , Semiconductor Physics , IR Photodetectors , Simulation
Profile Summary

Laurent Rubaldo was born in France in 1975. He received his engineering diploma from INSA Toulouse in 1997, his Ph.D. in Physics from the University Grenoble Alpes (formerly University Joseph Fourier of Grenoble) in 2001, and his Habilitation to supervise research from the same university in 2019. He joined STMicroelectronics in 2001, first as an R&D engineer for device characterisation, and moved to a position of technical leader for process development. In 2007, he joined LYNRED (formerly Sofradir Group) as R&D engineer to work on the electro-optical characterisation and performance optimisation of cooled IR photodetectors. Since 2017, he has held the position of Senior Expert in semiconductor and optoelectronic technologies. Involved in academic and research partner networks, he is coordinator of the DEFIR joint laboratory with CEA-Leti and vice-director of the DECID joint laboratory with CROMA-CNRS since 2021. Member of the Grenoble-INP UGA and Fondation Grenoble INP boards, he is chairman of the board of the Phelma engineering school since 2021.
He is the author of seven patents and more than one hundred scientific articles. He has supervised 8 doctoral theses.

Publications (47)

Proceedings Article | 10 June 2024 Presentation
Olivier Gravrand, Clément Lobre, Cecile Grezes, Titouan LeGoff, Diane Sam-Giao, Florent Rochette, Nicolas Baier, Laurent Rubaldo
Proceedings Volume 13046, 130460V (2024) https://doi.org/10.1117/12.3014111
KEYWORDS: Temperature metrology, Staring arrays, Mid-IR, Fabrication, Dark current

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13046, 1304614 (2024) https://doi.org/10.1117/12.3014159
KEYWORDS: Staring arrays, Modulation transfer functions, Mid-IR, Black bodies, Readout integrated circuits, Quantum noise, Image quality, Nonuniformity corrections, Infrared radiation

Proceedings Article | 7 June 2024 Presentation + Paper
Laurent Rubaldo, Nicolas Morisset, Alexandre Brunner, Cécile Grezes, Nicolas Péré-Laperne, Gulnar Dagher, Alexandra Blay, Alexandre Kerlain, Clement Lobre, Olivier Gravrand, Pierre Jenouvrier, David Billon-Lanfrey
Proceedings Volume 13046, 130460I (2024) https://doi.org/10.1117/12.3013662
KEYWORDS: Fluctuations and noise, Quantum efficiency, Reproducibility, Diodes, Nonuniformity corrections, Readout integrated circuits, Staring arrays, Medium wave, Modulation transfer functions

Proceedings Article | 7 June 2024 Presentation + Paper
G. Jobert, N. Vannier, S. Pelletier, R. Delubac, X. Brenière, N. Péré-Laperne, L. Rubaldo
Proceedings Volume 13046, 1304609 (2024) https://doi.org/10.1117/12.3014161
KEYWORDS: Short wave infrared radiation, Aerosols, Visibility, Cameras, Atmospheric particles, Modulation transfer functions, Sensors, Light scattering, Indium gallium arsenide, Visible radiation

Proceedings Article | 13 June 2023 Presentation + Paper
S. Bustillos Vasco, N. Baier, C. Lobre, O. Gravrand, L. Rubaldo
Proceedings Volume 12534, 1253412 (2023) https://doi.org/10.1117/12.2663758
KEYWORDS: Modulation transfer functions, Diodes, Mercury cadmium telluride, Monte Carlo methods, Diffusion, Point spread functions, Photons, Staring arrays, Electron beams, Scanning electron microscopy, Infrared detectors, Pixel resolution

Showing 5 of 47 publications
Conference Committee Involvement (8)
Infrared Technology and Applications LI
13 April 2025 | Orlando, Florida, United States
Infrared Technology and Applications L
21 April 2024 | National Harbor, Maryland, United States
Infrared Technology and Applications XLIX
30 April 2023 | Orlando, Florida, United States
Infrared Technology and Applications XLVIII
3 April 2022 | Orlando, Florida, United States
Infrared Technology and Applications XLVII
12 April 2021 | Online Only, Florida, United States
Showing 5 of 8 Conference Committees
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