Dr. Laurent Rubaldo
R&D Scientist - Technical Expert at LYNRED
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Optoelectronic , Electrical characterization , Electro-optical characterization , Semiconductor Physics , IR Photodetectors , Simulation
Profile Summary

Laurent Rubaldo was born in France, in1975. He received the Ph.D. degree in Physics from the University Joseph Fourier of Grenoble in 2001. He did his Ph.D. at the High Magnetic Field Laboratory of CNRS Grenoble in collaboration with the Institute of Science and Technology of the Manchester University. He studied deep levels in silicon, silicon alloys and III-V materials by Laplace DLTS, combining magnetic field and uniaxial stress to investigate the electronic and structural properties of defects.
He joined STMicroelectronics (Crolles France) in 2001 first as reliability Engineer, to study and modelize new hot carrier mechanisms for submicron CMOS transistors and in 2003 he joined the Front End Material R&D group to develop ultra-doped epitaxial Si and Si alloys by MOCVD. In 2007, he joined the Sofradir Group in the R&D Department, as a Semiconductor Characterization Expert, to work on electro-optical characterization and performances optimization of cooled IR Photodetectors.
Publications (38)

Proceedings Article | 5 May 2020 Presentation + Paper
Proc. SPIE. 11407, Infrared Technology and Applications XLVI
KEYWORDS: Diffraction, Mercury cadmium telluride, Sensors, Diffusion, Quantum efficiency, Finite element methods, Diodes, Modulation transfer functions, Minimum resolvable temperature difference, Anisotropy

Proceedings Article | 7 May 2019 Paper
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Readout integrated circuits, Nonuniformity corrections, Sensors, Quantum efficiency, Image quality, Finite element methods, Diodes, Modulation transfer functions, Medium wave

Proceedings Article | 7 May 2019 Paper
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Staring arrays, Nonuniformity corrections, Short wave infrared radiation, Indium gallium arsenide, Cameras, Sensors, Diffusion, Photodiodes, Sensor performance, Image quality

Proceedings Article | 14 May 2018 Presentation + Paper
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Staring arrays, Mercury cadmium telluride, Sensors, Image processing, Crystals, Manufacturing, Zinc, Image quality, Electro optics

Proceedings Article | 14 May 2018 Presentation + Paper
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Staring arrays, Nonuniformity corrections, Indium gallium arsenide, Liquid phase epitaxy, Mercury cadmium telluride, Sensors, Crystals, Image quality, Image sensors, Medium wave

Showing 5 of 38 publications
Conference Committee Involvement (4)
Infrared Technology and Applications XLVII
11 April 2021 | Orlando, Florida, United States
Infrared Technology and Applications XLVI
27 April 2020 | Online Only, California, United States
Infrared Technology and Applications XLV
14 April 2019 | Baltimore, Maryland, United States
Infrared Technology and Applications XLIV
16 April 2018 | Orlando, Florida, United States
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