Mr. Lan Zhu
at USST
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Monochromatic aberrations, Visualization, Sensors, Wavefronts, Wavefront aberrations, Optical testing, Zernike polynomials, Precision measurement, Charge-coupled devices, Visual optics

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top