Dr. Lars Kinell
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Calibration, 3D modeling, Optical testing, 3D metrology, Projection systems, Finite element methods, Optical simulations, Computer aided design, Solid modeling, Reverse modeling

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