Dr. Laurent Y. Roussel
Sales Representative at FEI Co
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 22, 2009
Proc. SPIE. 7378, Scanning Microscopy 2009
KEYWORDS: Chromatic aberrations, Electron beams, Contamination, Sensors, Crystals, Image resolution, Electron microscopes, Scanning electron microscopy, Monochromators, Scanning transmission electron microscopy

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