Dr. Laurie Bechtler
Sr. Technical Writer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 April 2003
Proc. SPIE. 4944, Integrated Optical Devices: Fabrication and Testing
KEYWORDS: Wafer-level optics, Metrology, Sensors, Glasses, Particles, Silicon, Inspection, Semiconducting wafers, Signal detection, Phase shifts

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