Prof. Geng Lei
at Tianjin Polytechnic Univ
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | April 10, 2018
Proc. SPIE. 10615, Ninth International Conference on Graphic and Image Processing (ICGIP 2017)
KEYWORDS: Defect detection, Image segmentation, Image processing, Inspection, Feature extraction, Optical inspection, Neural networks, Image classification, Convolution, Classification systems

PROCEEDINGS ARTICLE | April 10, 2018
Proc. SPIE. 10615, Ninth International Conference on Graphic and Image Processing (ICGIP 2017)
KEYWORDS: Data modeling, Blood vessels, Image segmentation, Image processing, Feature extraction, Machine vision, Deconvolution, Neural networks, Convolution, Network architectures

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Imaging systems, Cameras, Calibration, Image segmentation, Image processing, Clouds, 3D metrology, Filtering (signal processing), 3D image processing, Structured light

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Imaging systems, Sensors, Metals, Image segmentation, Image processing, Manufacturing, Feature extraction, CCD cameras, Binary data, Structured light

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Target detection, Edge detection, Cameras, Calibration, Image segmentation, Error analysis, Reflectivity, Chromium, Convolution, Adhesives

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Edge detection, Imaging systems, Cameras, Calibration, Image processing, Distortion, Optical testing, Distance measurement, Line scan cameras, Structured light

Showing 5 of 7 publications
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