Mr. Lei Lu
at Henan University of Technology
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | May 22, 2014
OE Vol. 53 Issue 11
KEYWORDS: Fringe analysis, Motion estimation, Reconstruction algorithms, Optical engineering, Motion measurement, Cameras, Phase shifting, Lutetium, Time metrology, 3D metrology

PROCEEDINGS ARTICLE | November 20, 2012
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Fringe analysis, Phase shifting, Modulation, Cameras, Error analysis, Reflectivity, Phase shift keying, 3D metrology, Motion analysis, Phase shifts

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