CONFERENCE PROCEEDINGS
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Dr. Lei Lu
at Henan Univ. of Technology
SPIE Involvement:
Author
Publications (6)
PROCEEDINGS ARTICLE | November 2, 2018
A new phase unwrapping method for phase shifting profilometry with object in motion
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Fringe analysis, Phase shifting, Phase measurement
PROCEEDINGS ARTICLE | July 24, 2018
Simulation study on improving the spatial resolution of absolute phase map recovered by fringe projection profilometry with the images of different resolutions
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Fringe analysis, Cameras, Image resolution, 3D modeling, 3D metrology, Projection systems, Image filtering, Spatial resolution, Algorithm development, 3D image processing
PROCEEDINGS ARTICLE | July 24, 2018
A new phase retrieve method for phase shifting profilometry with object in motion
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Fringe analysis, Phase shifting, Projection systems, Reconstruction algorithms, Motion models
PROCEEDINGS ARTICLE | May 24, 2018
Two-step phase shifting in fringe projection: modeling and analysis
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Fringe analysis, Cameras, Image processing, Error analysis, Reflectivity, 3D metrology, Projection systems, Optics manufacturing, Phase shifts
SPIE Journal Paper | May 22, 2014
New approach to improve the performance of fringe pattern profilometry using multiple triangular patterns for the measurement of objects in motion
OE Vol. 53 Issue 11
KEYWORDS: Fringe analysis, Motion estimation, Reconstruction algorithms, Optical engineering, Motion measurement, Cameras, Phase shifting, Lutetium, Time metrology, 3D metrology
PROCEEDINGS ARTICLE | November 20, 2012
An approach to compensate the object movement errors in phase shifting profilometry
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Fringe analysis, Phase shifting, Modulation, Cameras, Error analysis, Reflectivity, Phase shift keying, 3D metrology, Motion analysis, Phase shifts
Showing 5 of 6 publications
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