Dr. Lei Lu Profile

Dr. Lei Lu

at Henan Univ of Technology

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Author

Publications (10)

Proceedings Article | 10 October 2020 Poster + Paper

A new phase unwrapping method based on inner-fringe coding

Zhigang Jin, Lei Lu, Ke Wu

Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII

KEYWORDS: Fringe analysis, Phase shifting

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SPIE Journal Paper | 25 March 2020

Recursive-iterative digital image correlation based on salient features

Zhilong Su, Lei Lu, Xiaoyuan He, Fujun Yang, Dongsheng Zhang

OE Vol. 59 Issue 03

KEYWORDS: Digital image correlation, Speckle pattern, Image quality, Optical engineering, Digital imaging, Feature selection, Image analysis, Image processing, Optical testing, Image registration

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Proceedings Article | 16 October 2019 Paper

A method for dynamic 3D shape measurements based on multiple-shot FTP and motion compensation

Chengpu Duan, Jun Tong, Jiangtao Xi, Yiwei Zhang, Yanguang Yu, Qinghua Guo, Lei Lu

Proc. SPIE. 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)

KEYWORDS: Signal to noise ratio, Fringe analysis, 3D acquisition, Cameras, Fourier transforms, 3D modeling, 3D metrology, Motion measurement

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Proceedings Article | 16 October 2019 Paper

A fringe projection profilometry scheme based on embedded speckle patterns and robust principal component analysis

Yiwei Zhang, Jun Tong, Jiangtao Xi, Chengpu Duan, Yanguang Yu, Qinghua Guo, Lei Lu

Proc. SPIE. 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)

KEYWORDS: Signal to noise ratio, Superposition, Fringe analysis, Principal component analysis, Speckle, Error analysis, Composites, Speckle pattern, 3D metrology, Shape analysis

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Proceedings Article | 2 November 2018 Paper

A new phase unwrapping method for phase shifting profilometry with object in motion

Zhaoyi Jia, Lei Lu, Chunhua Zhu, Yinsen Luan, Jiangtao Xi

Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V

KEYWORDS: Fringe analysis, Phase shifting, Phase measurement

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Proceedings Article | 24 July 2018 Paper

Simulation study on improving the spatial resolution of absolute phase map recovered by fringe projection profilometry with the images of different resolutions

Yi Ding, Qiong Liu, Zhenwei Yuan, Lei Lu, Jiangtao Xi

Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)

KEYWORDS: Fringe analysis, Cameras, Image resolution, 3D modeling, 3D metrology, Projection systems, Image filtering, Spatial resolution, Algorithm development, 3D image processing

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Proceedings Article | 24 July 2018 Paper

A new phase retrieve method for phase shifting profilometry with object in motion

Haoran Guo, Lei Lu, Chunhua Zhu, Yi Ding, Yinsen Luan, Jiangtao Xi

Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)

KEYWORDS: Fringe analysis, Phase shifting, Projection systems, Reconstruction algorithms, Motion models

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Proceedings Article | 24 May 2018 Presentation + Paper

Two-step phase shifting in fringe projection: modeling and analysis

Jiaqi Mao, Yongkai Yin, Xiangfeng Meng, Xiulun Yang, Lei Lu, Dechun Li, Christian Pape, Eduard Reithmeier

Proc. SPIE. 10678, Optical Micro- and Nanometrology VII

KEYWORDS: Fringe analysis, Cameras, Image processing, Error analysis, Reflectivity, 3D metrology, Projection systems, Optics manufacturing, Phase shifts

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SPIE Journal Paper | 22 May 2014

New approach to improve the performance of fringe pattern profilometry using multiple triangular patterns for the measurement of objects in motion

Lei Lu, Jiangtao Xi, Yanguang Yu, Qinghua Guo

OE Vol. 53 Issue 11

KEYWORDS: Fringe analysis, Motion estimation, Reconstruction algorithms, Optical engineering, Motion measurement, Cameras, Phase shifting, Lutetium, Time metrology, 3D metrology

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Proceedings Article | 20 November 2012 Paper

An approach to compensate the object movement errors in phase shifting profilometry

Lei Lu, Jiangtao Xi, Yanguang Yu, Limei Song

Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Cameras, Error analysis, Reflectivity, Phase shift keying, 3D metrology, Motion analysis, Phase shifts

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Showing 5 of 10 publications

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