Dr. Lei Lu
at Henan Univ. of Technology
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | November 2, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Fringe analysis, Phase shifting, Phase measurement

PROCEEDINGS ARTICLE | July 24, 2018
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Fringe analysis, Cameras, Image resolution, 3D modeling, 3D metrology, Projection systems, Image filtering, Spatial resolution, Algorithm development, 3D image processing

PROCEEDINGS ARTICLE | July 24, 2018
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Fringe analysis, Phase shifting, Projection systems, Reconstruction algorithms, Motion models

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Fringe analysis, Cameras, Image processing, Error analysis, Reflectivity, 3D metrology, Projection systems, Optics manufacturing, Phase shifts

SPIE Journal Paper | May 22, 2014
OE Vol. 53 Issue 11
KEYWORDS: Fringe analysis, Motion estimation, Reconstruction algorithms, Optical engineering, Motion measurement, Cameras, Phase shifting, Lutetium, Time metrology, 3D metrology

PROCEEDINGS ARTICLE | November 20, 2012
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Fringe analysis, Phase shifting, Modulation, Cameras, Error analysis, Reflectivity, Phase shift keying, 3D metrology, Motion analysis, Phase shifts

Showing 5 of 6 publications
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