Prof. Lei Tian
Assistant Professor
SPIE Involvement:
Conference Program Committee | Conference Chair | Author | Editor
Area of Expertise:
Computational imaging , digital holography , computational illumination , phase imaging , compressive imaging , three dimensional imaging
Websites:
Publications (12)

PROCEEDINGS ARTICLE | March 15, 2018
Proc. SPIE. 10510, Frontiers in Biological Detection: From Nanosensors to Systems X
KEYWORDS: Diffraction, Super resolution, Computational imaging, Scattering, Nanoparticles, Microscopy, Interferometry, Digital imaging, Fourier optics, Optical biosensors

SPIE Conference Volume | June 13, 2017

PROCEEDINGS ARTICLE | May 10, 2017
Proc. SPIE. 10219, Three-Dimensional Imaging, Visualization, and Display 2017
KEYWORDS: Microscopes, Light emitting diodes, Computational imaging, Microscopy, Complex systems, Computing systems, Image resolution, 3D modeling, Phase retrieval, Phase imaging, Sensing systems, Reconstruction algorithms, Optimization (mathematics), Model-based design, 3D image processing

SPIE Conference Volume | September 27, 2016

PROCEEDINGS ARTICLE | July 1, 2016
Proc. SPIE. 9713, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII
KEYWORDS: Microscopes, Diffraction, Light emitting diodes, Super resolution, Digital holography, Computational imaging, Microscopy, Image resolution, Phase imaging, Coded aperture imaging, 3D image processing, Synthetic aperture microscopy

PROCEEDINGS ARTICLE | April 12, 2016
Proc. SPIE. 9718, Quantitative Phase Imaging II
KEYWORDS: Refractive index, Light emitting diodes, Phase contrast, Imaging systems, Scattering, Microscopy, 3D modeling, 3D metrology, Electroluminescent displays, 3D image processing

Showing 5 of 12 publications
Conference Committee Involvement (15)
High-Speed Biomedical Imaging and Spectroscopy IV
2 February 2019 | San Francisco, California, United States
Optoelectronic Imaging and Multimedia Technology V
11 October 2018 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Anomaly Detection and Imaging with X-Rays (ADIX) III
17 April 2018 | Orlando, Florida, United States
Computational Imaging III
15 April 2018 | Orlando, Florida, United States
Showing 5 of 15 published special sections
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