Lei Wei
at University of Chinese Academy of Sciences
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 September 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Principal component analysis, Image compression, Detection and tracking algorithms, Data modeling, Image processing, Video, Wavelets, Feature extraction, Statistical modeling, Instrument modeling

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