Dr. Leland J. Spangler
at Aspen Technologies Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 December 2003 Paper
Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.531901
KEYWORDS: Microsystems, Reliability, Semiconducting wafers, Gold, Adhesives, Metals, Packaging, Optical inspection, Microelectromechanical systems, Materials processing

Proceedings Article | 20 May 1996 Paper
Leland Spangler, Christopher Kemp
Proceedings Volume 2722, (1996) https://doi.org/10.1117/12.240438
KEYWORDS: Sensors, Calibration, Clocks, Reliability, Digital electronics, Modulators, Signal processing, Smart sensors, Microelectronics, Switches

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