Lennart J. de Vreede
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 20 November 2017
Proc. SPIE. 10565, International Conference on Space Optics — ICSO 2010
KEYWORDS: Wafer-level optics, Mirrors, X-ray optics, X-rays, Silicon, Manufacturing, Space telescopes, Spatial resolution, Semiconducting wafers, Optics manufacturing

Proceedings Article | 29 July 2010
Proc. SPIE. 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
KEYWORDS: Mirrors, X-ray optics, Polishing, Particles, X-rays, Silicon, Surface roughness, X-ray telescopes, Semiconducting wafers, Optics manufacturing

Proceedings Article | 31 August 2009
Proc. SPIE. 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
KEYWORDS: Wafer-level optics, Oxides, Mirrors, X-rays, Silicon, Coating, Manufacturing, Reflectivity, Semiconducting wafers, Optics manufacturing

Proceedings Article | 31 August 2009
Proc. SPIE. 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
KEYWORDS: Observatories, Telescopes, Mirrors, X-ray optics, X-rays, Silicon, Spatial resolution, Semiconducting wafers, Optics manufacturing, X-ray technology

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