Mr. Leo H. C. Braga Profile

Leo H. C. Braga

PhD Student

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Author

Publications (4)

SPIE Journal Paper | 1 June 2016

Cross-talk characterization of dense single-photon avalanche diode arrays in CMOS 150-nm technology

Hesong Xu, Lucio Pancheri, Leo H. Braga, Gian-Franco Dalla Betta, David Stoppa

OE, Vol. 55, Issue 06, 067102, (June 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.6.067102

KEYWORDS: Integrated optics, Avalanche photodiodes, CMOS technology, Sensors, Structural design, Imaging systems, Optical engineering, Multiplexers, Photodetectors, Single photon detectors

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Proceedings Article | 15 May 2014 Paper

Characterization of single-photon avalanche photodiodes in CMOS 150nm technology

Hesong Xu, Lucio Pancheri, Leo H. Braga, David Stoppa

Proceedings Volume 9141, 91410A (2014) https://doi.org/10.1117/12.2052266

KEYWORDS: Plasma display panels, CMOS technology, Avalanche photodiodes, Photodetectors, CMOS sensors, Transistors, Green light emitting diodes, Quantum efficiency, Standards development, Imaging systems

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Proceedings Article | 8 May 2014 Paper

SPADnet: a fully digital, scalable, and networked photonic component for time-of-flight PET applications

Claudio Bruschini, Edoardo Charbon, Chockalingam Veerappan, Leo H. Braga, Nicola Massari, Matteo Perenzoni, Leonardo Gasparini, David Stoppa, Richard Walker, Ahmet Erdogan, Robert Henderson, Steve East, Lindsay Grant, Balázs Játékos, Ferenc Ujhelyi, Gábor Erdei, Emöke Lörincz, Luc André, Laurent Maingault, David Jacolin, L. Verger, Eric Gros d'Aillon, Peter Major, Zoltan Papp, Gabor Nemeth

Proceedings Volume 9129, 912913 (2014) https://doi.org/10.1117/12.2051952

KEYWORDS: Sensors, Positron emission tomography, Scintillators, Photons, CMOS sensors, Crystals, Intelligent sensors, Scintillation, Solar concentrators, Data processing

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Proceedings Article | 18 May 2009 Paper

A signal-to-noise ratio comparison of high dynamic range CMOS image sensors

Leo H. Braga, Suzana Domingues, José Gomes, Antonio Mesquita

Proceedings Volume 7356, 735619 (2009) https://doi.org/10.1117/12.820367

KEYWORDS: Signal to noise ratio, Sensors, High dynamic range image sensors, High dynamic range imaging, CMOS sensors, Image sensors, Nickel, Image quality, Interference (communication), Quantization

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