Dr. Leo J. Schowalter
Chief Technology Officer at Crystal IS Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (4)

Proceedings Article | 8 March 2014
Proc. SPIE. 8986, Gallium Nitride Materials and Devices IX
KEYWORDS: Light emitting diodes, Ultraviolet radiation, Crystals, Reliability, Lamps, Gallium nitride, Aluminum nitride, Analytical research, Lead, Absorption

Proceedings Article | 3 March 2006
Proc. SPIE. 6121, Gallium Nitride Materials and Devices
KEYWORDS: Ultraviolet radiation, Crystals, X-rays, Atomic force microscopy, Aluminum, Aluminum nitride, Silicon carbide, Semiconducting wafers, Gallium, Temperature metrology

Proceedings Article | 15 September 2005
Proc. SPIE. 5941, Fifth International Conference on Solid State Lighting
KEYWORDS: Diffraction, Quantum wells, Luminescence, Crystals, Transmission electron microscopy, Gallium nitride, Sapphire, Optical spectroscopy, Aluminum nitride, Indium gallium nitride

Proceedings Article | 12 August 1992
Proc. SPIE. 1683, Infrared Focal Plane Array Producibility and Related Materials
KEYWORDS: Gold, Scattering, Signal attenuation, Metals, Microscopy, Interfaces, Silicon, Spatial resolution, Electron transport, Scanning tunneling microscopy

Conference Committee Involvement (1)
GaN Materials and Devices
23 January 2006 | San Jose, California, United States
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