Leon G. Castro
at NUtech Ventures
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 July 2003 Paper
Daniel Thompson, Galen Pfeiffer, Emil Berberov, Leon Castro, John Woollam
Proceedings Volume 4965, (2003) https://doi.org/10.1117/12.479262
KEYWORDS: Ellipsometry, Infrared radiation, Chemical analysis, Visible radiation, Reflection, Silicon, Spectroscopic ellipsometry, Optical testing, Absorption, Molecules

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top