Dr. Leonid Khriachtchev
at Aalto Univ School of Science and Technology
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | May 22, 2007
Proc. SPIE. 6591, Nanotechnology III
KEYWORDS: Silica, Annealing, Crystals, Interfaces, Silicon, Semiconductor lasers, Raman spectroscopy, Thermal effects, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | April 20, 2006
Proc. SPIE. 6195, Nanophotonics
KEYWORDS: Refractive index, Etching, Annealing, Luminescence, Silicon, Transmission electron microscopy, Raman spectroscopy, Superlattices, Stereolithography, High temperature raman spectroscopy

PROCEEDINGS ARTICLE | July 7, 2005
Proc. SPIE. 5840, Photonic Materials, Devices, and Applications
KEYWORDS: Silica, Annealing, Crystals, Silicon, Raman spectroscopy, Laser crystals, Nanocrystals, Temperature metrology, High temperature raman spectroscopy, Absorption

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