Dr. Leonid Khriachtchev
at Aalto Univ School of Science and Technology
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | May 22, 2007
Proc. SPIE. 6591, Nanotechnology III
KEYWORDS: Silicon, Raman spectroscopy, Silica, Annealing, Semiconductor lasers, Crystals, Temperature metrology, Thermal effects, Absorption, Interfaces

PROCEEDINGS ARTICLE | April 20, 2006
Proc. SPIE. 6195, Nanophotonics
KEYWORDS: Stereolithography, Silicon, Superlattices, Annealing, Raman spectroscopy, Luminescence, Etching, Transmission electron microscopy, Refractive index, High temperature raman spectroscopy

PROCEEDINGS ARTICLE | July 7, 2005
Proc. SPIE. 5840, Photonic Materials, Devices, and Applications
KEYWORDS: Raman spectroscopy, Silicon, Silica, Annealing, Absorption, Crystals, Laser crystals, Nanocrystals, High temperature raman spectroscopy, Temperature metrology

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