Prof. Lev Yarower
at Tel Aviv Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Diffraction, Holograms, 3D image reconstruction, Digital holography, Fourier transforms, Wavefronts, Reconstruction algorithms, Digital recording, Integral transforms, Francium

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