Dr. Li-Ping Zhao
Senior Research Engineer at Singapore Institute of Manufacturing Technology
SPIE Involvement:
Author
Publications (28)

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Diffraction, Metrology, Aerospace engineering, Wavefront sensors, Wavefronts, Image analysis, Image registration, Sensing systems, Charge-coupled devices, Reconstruction algorithms

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Metrology, Error analysis, Wavefront sensors, Wavefronts, Numerical simulations, Optical testing, Spatial light modulators, Spherical lenses, Optics manufacturing, Radio frequency weapons

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7390, Modeling Aspects in Optical Metrology II
KEYWORDS: Refractive index, MATLAB, Sensors, Wavefront sensors, Wavefronts, Computer simulations, Sensing systems, Optical simulations, Charge-coupled devices, Spherical lenses

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7390, Modeling Aspects in Optical Metrology II
KEYWORDS: Optical components, Zemax, Inspection, Zinc, Wavefront sensors, Wavefronts, Zernike polynomials, Helium neon lasers, Optics manufacturing, Light wave propagation

PROCEEDINGS ARTICLE | October 3, 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Optical components, Optical design, Light sources, Image processing, Manufacturing, Wavefront sensors, Wavefronts, Wave propagation, Bridges, Spherical lenses

PROCEEDINGS ARTICLE | October 3, 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Microscopes, Light emitting diodes, Imaging systems, Calibration, Image processing, Manufacturing, Inspection, 3D metrology, Light sources and illumination, Stem cells

Showing 5 of 28 publications
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