Li-Te Fang
at National Chiao Tung Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 9, 2006
Proc. SPIE. 6070, Machine Vision Applications in Industrial Inspection XIV
KEYWORDS: Defect detection, Detection and tracking algorithms, Inspection, Fourier transforms, Optical inspection, LCDs, Image filtering, Convolution, Electronic filtering, V band

PROCEEDINGS ARTICLE | February 24, 2005
Proc. SPIE. 5679, Machine Vision Applications in Industrial Inspection XIII
KEYWORDS: Signal to noise ratio, Defect detection, Detection and tracking algorithms, Cameras, Photography, Inspection, LCDs, Electronic filtering, Algorithm development, V band

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