Li Chao
at Shanghai Institute of Technical Physics CAS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 18, 2008
Proc. SPIE. 7135, Optoelectronic Materials and Devices III
KEYWORDS: Refractive index, Statistical analysis, Scattering, Interfaces, Light scattering, Reflectivity, Gallium nitride, Sapphire, Transmittance, Absorption

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top