Mr. Li Yan
at Univ of Nebraska/Lincoln
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
KEYWORDS: Thin films, Ellipsometry, Refractive index, Data modeling, Calibration, Infrared spectroscopy, Spectroscopic ellipsometry, Infrared radiation, Vacuum ultraviolet, Anisotropy

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