Dr. Liangyu He
at
SPIE Involvement:
Author
Area of Expertise:
optical design and fabrication , image process , interferometry , instrumentation , laser , metrology
Publications (1)

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Astronomy, Metrology, Visualization, Spatial frequencies, Image processing, Surface roughness, Mechanical engineering, Optics manufacturing, Surface finishing, Anisotropy

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