Prof. Lianhua Jin
Associate Professor at Univ of Yamanashi
SPIE Involvement:
Conference Program Committee | Author
Publications (17)

Proceedings Article | 15 June 2020
Proc. SPIE. 11523, Optical Technology and Measurement for Industrial Applications 2020
KEYWORDS: Optical components, Ellipsometry, Imaging systems, Calibration, Spectroscopy, Optical microscopy, Imaging spectroscopy, Optical testing, Image sensors, Spatial resolution

Proceedings Article | 2 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Prisms, Multilayers, Beam splitters, Dielectrics, Coating, Polarizers, Wave plates, Polarimetry, Dielectric polarization

Proceedings Article | 2 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Image processing, Optical testing, Image filtering, Geometrical optics, Optical instrument design, Optics manufacturing

Proceedings Article | 10 September 2011
Proc. SPIE. 8160, Polarization Science and Remote Sensing V
KEYWORDS: Refractive index, Polishing, Polarization, Reflection, Scattering, Glasses, Light scattering, Diffusers, Virtual reality, Surface finishing

Proceedings Article | 31 December 2010
Proc. SPIE. 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Optical filters, Mirrors, Fabry–Perot interferometers, Polarization, Crystals, Modulators, Tunable filters, Geometrical optics, Electronic filtering, Electro optics

Showing 5 of 17 publications
Conference Committee Involvement (6)
Optical Metrology and Inspection for Industrial Applications VII
11 October 2020 | Beijing, China
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications II
5 November 2012 | Beijing, China
Showing 5 of 6 Conference Committees
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