Prof. Lianhua Jin
Associate Professor at Univ of Yamanashi
SPIE Involvement:
Conference Program Committee | Author
Publications (16)

Proceedings Article | 2 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Prisms, Multilayers, Beam splitters, Dielectrics, Coating, Polarizers, Wave plates, Polarimetry, Dielectric polarization

Proceedings Article | 2 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Image processing, Optical testing, Image filtering, Geometrical optics, Optical instrument design, Optics manufacturing

Proceedings Article | 10 September 2011
Proc. SPIE. 8160, Polarization Science and Remote Sensing V
KEYWORDS: Refractive index, Polishing, Polarization, Reflection, Scattering, Glasses, Light scattering, Diffusers, Virtual reality, Surface finishing

Proceedings Article | 31 December 2010
Proc. SPIE. 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Optical filters, Mirrors, Fabry–Perot interferometers, Polarization, Crystals, Modulators, Tunable filters, Geometrical optics, Electronic filtering, Electro optics

Proceedings Article | 10 September 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Ellipsometry, Polishing, Modulation, Polarization, Scattering, Light scattering, Laser scattering, Modulators, Specular reflections, Surface finishing

SPIE Journal Paper | 1 September 2008
OE Vol. 47 Issue 09
KEYWORDS: Cameras, Imaging systems, Glasses, CCD cameras, Aluminum, Fermium, Frequency modulation, Sensing systems, Image processing, Video

Showing 5 of 16 publications
Conference Committee Involvement (4)
Optical Metrology and Inspection for Industrial Applications VI
20 October 2019 | Hangzhou, China
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications II
5 November 2012 | Beijing, China
Optical Metrology and Inspection for Industrial Applications
18 October 2010 | Beijing, China
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