Lijuan Zhao
at North China Electric Power Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 20, 2009
Proc. SPIE. 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Signal to noise ratio, Backscatter, Scattering, Light scattering, Time metrology, Signal processing, Rayleigh scattering, Spatial resolution, Signal detection, Temperature metrology

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