Lili Chen
at Fraunhofer IKTS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 September 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Defect detection, Speckle, Cameras, Sensors, Ceramics, Inspection, Nondestructive evaluation, Speckle pattern, Photometry, Correlation function

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