Limao Tian
at Waseda Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 June 2020
Proc. SPIE. 11526, Fifth International Workshop on Pattern Recognition
KEYWORDS: 3D acquisition, 3D image reconstruction, Calibration, Video, Pattern recognition, 3D modeling, Computer vision technology, Machine vision, 3D vision, 3D image processing

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