In this research, we systematically investigated the image classification accuracy of Fourier Ptychography Microscopy (FPM). Multiple linear regression of image classification accuracy (dependent variable), PSNR and SSIM (independent variables) was performed. Notebly, results show that PSNR, SSIM, and image classification accuracy has a linear relationship. It is therefore feasible to predict the image classification accuracy only based on PSNR and SSIM. It is also found that image classification accuracy of the FPM is not universally significantly differed from the lower resolution image under the higher numerical aperture (NA) condition. The difference is yet much more pronounced under the lower NA condition.
Nanostructures like a piece of porous film with an array of nanoholes have many interesting properties with the existence of surface plasmon resonance. In this paper we use numerical simulation method to calculate the electric field and phase properties in near and far fields of a metal nanohole array. The effect of SPP on the near-field polarization state was found in the results. We also introduced a ring array structure which has a higher normalized transmission rate and two transmission peaks. In which we observed the existence of polarization singularities and the topology of the surrounding electric field is also determined.