Dr. Lin Zschiedrich
at JCMwave GmbH
SPIE Involvement:
Publications (56)

Proceedings Article | 23 August 2023 Presentation + Paper
Martin Hammerschmidt, Lin Zschiedrich, Lauryna Siaudinyté, Phillip Manley, Philipp-Immanuel Schneider, Sven Burger
Proceedings Volume PC12619, PC1261907 (2023) https://doi.org/10.1117/12.2673231
KEYWORDS: Light sources and illumination, Physical coherence, Scatterometry, Sampling rates, Laser scattering, Optical gratings, Systems modeling, Interpolation, Gaussian beams, Finite element methods

Proceedings Article | 23 August 2023 Presentation
Jan Krüger, Bernd Bodermann, Rainer Köning, Phillip Manley, Lin Zschiedrich, Philipp-Immanuel Schneider, Andreas Heinrich, Christian Eder, Ulrike Zeiser, Aksel Goehnermeier
Proceedings Volume PC12619, PC126190A (2023) https://doi.org/10.1117/12.2672294
KEYWORDS: Optical aberrations, Imaging systems, Optical microscopes, Metrology, Point spread functions, Simulations, Reflection, Quality systems, Polarization, Objectives

Proceedings Article | 23 August 2023 Presentation
Phillip Manley, Jan Krüger, Bernd Bodermann, Rainer Köning, Andreas Heinrich, Christian Eder, Aksel Goehnermeier, Ulrike Zeiser, Martin Hammerschmidt, Lin Zschiedrich, Philipp-Immanuel Schneider
Proceedings Volume PC12619, PC126190B (2023) https://doi.org/10.1117/12.2673077
KEYWORDS: Nanostructures, Electron microscopy, Scattering, Diffraction limit, Diffraction, Optical microscopy, Near field optics, Near field, Multilayers, Modeling

Proceedings Article | 3 October 2022 Presentation
Philipp-Immanuel Schneider, Lin Zschiedrich, Martin Hammerschmidt, Lilli Kuen, Ivan Sekulic, Julien Kluge, Bastian Leykauf, Markus Krutzik, Sven Burger
Proceedings Volume 12227, 122270F (2022) https://doi.org/10.1117/12.2632419
KEYWORDS: Quantum optics, Stochastic processes, Performance modeling, Optimization (mathematics)

Proceedings Article | 20 May 2022 Paper
Philipp-Immanuel Schneider, Phillip Manley, Jan Krüger, Lin Zschiedrich, Rainer Köning, Bernd Bodermann, Sven Burger
Proceedings Volume 12137, 121370I (2022) https://doi.org/10.1117/12.2620762
KEYWORDS: Microscopes, Finite element methods, Microscopy, Data modeling, Image processing, Dimension reduction, Process modeling, Model-based design

Showing 5 of 56 publications
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