Lindsey M. Vencill
at Hitachi High-Tech America Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 October 2014 Open Access Paper
Robert Cormia, Michael Oye, Anh Nguyen, David Skiver, Meng Shi, Yessica Torres
Proceedings Volume 9236, 92360N (2014) https://doi.org/10.1117/12.2066250
KEYWORDS: Microscopy, Transmission electron microscopy, Scanning electron microscopy, Atomic force microscopy, Thin films, Analytical research, Internships, Atomic force microscope, Nanoparticles, Electron microscopy

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