Lindsey M. Vencill
at Hitachi High Technologies America, Inc.
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 2, 2014
Proc. SPIE. 9236, Scanning Microscopies 2014
KEYWORDS: Thin films, Nanoparticles, Microscopy, Atomic force microscopy, Scanning electron microscopy, Transmission electron microscopy, Electron microscopy, Atomic force microscope, Analytical research, Internships

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