Dr. Lingli Wang Profile

Dr. Lingli Wang

Director, Corporate Research & Development at Jos Schneider Optische Werke GmbH

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 20 April 2006 Paper

Multichip colour variable LED linear modules

Lingli Wang, Martijn Riemeijer, Georges Calon, Peter Deurenberg, Theo Treurniet, Edwin van Lier, Johan Ansems, Oscar Chao, Virginie Mercier, Koen van Os, Gerard Lijten

Proceedings Volume 6183, 618322 (2006) https://doi.org/10.1117/12.662666

KEYWORDS: Light emitting diodes, Temperature metrology, Free space optics, Reflectors, Sensors, Calibration, Optical design, Collimators, Dielectrics, Free space

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Proceedings Article | 26 February 2004 Paper

Transmission deflectometer for high-range lens slope measurement

Lingli Wang, Arno Ras, Willem Potze, Peter van de Goor

Proceedings Volume 5252, (2004) https://doi.org/10.1117/12.512937

KEYWORDS: Objectives, Mirrors, Calibration, Error analysis, Distortion, 3D metrology, Sensors, Reflectivity, Radium, Light sources and illumination

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Proceedings Article | 21 December 2001 Paper

Proximity printing by wave-optically designed masks

Frank Wyrowski, Ernst-Bernhard Kley, Sven Buehling, Ton Nellissen, Lingli Wang, Maarten Dirkzwager

Proceedings Volume 4436, (2001) https://doi.org/10.1117/12.451293

KEYWORDS: Photomasks, Photoresist materials, Printing, Chromium, Etching, Electron beam lithography, Binary data, Light sources, Phase modulation, Computer simulations

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Proceedings Article | 20 August 2001 Paper

High-resolution proximity printing by wave-optically designed masks

Ton Nellissen, Lingli Wang, Maarten Dirkzwager, Frank Wyrowski, Ernst-Bernhard Kley, Harald Aagendahl, Sven Buehling

Proceedings Volume 4343, (2001) https://doi.org/10.1117/12.436663

KEYWORDS: Photomasks, Photoresist materials, Printing, Detection and tracking algorithms, Diffraction, Collimation, Lithography, Chromium, Modulation, Optical lithography

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Proceedings Article | 26 April 2001 Paper

High-resolution proximity printing by wave-optically designed complex transmission masks

Sven Buehling, Frank Wyrowski, Ernst-Bernhard Kley, Ton Nellissen, Lingli Wang, Maarten Dirkzwager

Proceedings Volume 4404, (2001) https://doi.org/10.1117/12.425209

KEYWORDS: Photomasks, Photoresist materials, Printing, Chromium, Etching, Electron beam lithography, Binary data, Light sources, Phase modulation, Computer simulations

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SPIE Journal Paper | 1 June 2000

Speckle reduction in laser projections with ultrasonic waves

Lingli Wang, Theo Tschudi, Markus Boeddinghaus, Alexander Elbert, Thorsteinn Halldorsson, Palmi Petursson

OE, Vol. 39, Issue 06, (June 2000) https://doi.org/10.1117/12.10.1117/1.602543

KEYWORDS: Speckle, Ultrasonics, Speckle pattern, Modulation, Image quality, Argon ion lasers, Spatial coherence, Scanners, Laser based displays, Eye

Proceedings Article | 19 July 1999 Paper

Integrated optical pickup for optical disks

Theo Tschudi, Lingli Wang, Svetomir Stankovic, Mathias Hain, Shanti Bhattacharia, Daniel Diaz, Lhoucine Benmohammadi, Chialou Karaboue, Edgar Pawlowski, Margit Ferstl

Proceedings Volume 3749, (1999) https://doi.org/10.1117/12.354811

KEYWORDS: Integrated optics, Optical discs, Liquid crystals, Digital video discs, Diffractive optical elements, Packaging, Lenses, Applied physics, Compact discs, Optical storage

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Proceedings Article | 26 July 1993 Paper

Determination of slope and curvature in object deformation with computer generated hologram

Lingli Wang

Proceedings Volume 1983, 19836N (1993) https://doi.org/10.1117/12.2308658

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Proceedings Article | 23 July 1993 Paper

Moire shearing interferometry and mirror surface translation method for measurment of derivatives

Lingli Wang

Proceedings Volume 1983, 19838F (1993) https://doi.org/10.1117/12.2308722

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Proceedings Article | 1 December 1991 Paper

Curvature of bending shells by moire interferometry

Lingli Wang, Dazhen Yun

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57428

KEYWORDS: Moire patterns, Deflectometry, Diffraction gratings, Mechanics, Holographic interferometry, Interferometry, Spatial filters, Collimation, Fringe analysis, Diffraction

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