Lior Levin
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 April 2007 Paper
Ilan Englard, Raf Stegen, Erik Van Brederode, Peter Vanoppen, Ingrid Minnaert-Janssen, Frank Duray, Ted der Kinderen, Gazi Tanriseven, Inge Lamers, Mireia Blanco Mantecon, Lior Levin, Eitan Binyamini, Nurit Raccah, Shalev Dror, Eran Valfer, Ofer Rotlevi, Robert Schreutelkamp, Rich Piech
Proceedings Volume 6518, 65182G (2007) https://doi.org/10.1117/12.713466
KEYWORDS: Particles, Inspection, Scanning electron microscopy, Immersion lithography, Bridges, Library classification systems, Printing, Molecular bridges, Semiconducting wafers, Signal attenuation

Proceedings Article | 29 April 2004 Paper
Jacob Orbon, Lior Levin, Ofer Bokobza, Rinat Shimshi, Manjari Dutta, Brian Zhang, Dennis Ciplickas, Teri Pham, Jim Jensen
Proceedings Volume 5378, (2004) https://doi.org/10.1117/12.536469
KEYWORDS: Failure analysis, Inspection, Statistical analysis, Scanning electron microscopy, Visualization, Electrical breakdown, Diffractive optical elements, Semiconducting wafers, Back end of line, Metals

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