Dr. Liubomyr Vashchyshyn
at Lviv Polytechnic National Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 March 2019 Paper
Proceedings Volume 11055, 110551D (2019) https://doi.org/10.1117/12.2525037
KEYWORDS: Signal detection, Continuous wavelet transforms, Stochastic processes, Wavelets, Signal processing, Signal to noise ratio, Digital signal processing, Artificial neural networks, Defect detection

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