Lizhe Liu
at Huazhong Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Digital signal processing, Defect detection, Convolutional neural networks, Data modeling, Feature extraction, Machine vision

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