Lloyd F. Arrowood
at Y-12 National Security Complex
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 1 July 2010
JEI, Vol. 19, Issue 3, 031208, (July 2010) https://doi.org/10.1117/12.10.1117/1.3489122
KEYWORDS: Nondestructive evaluation, X-ray computed tomography, Computer simulations, Signal to noise ratio, Image registration, X-rays, Computed tomography, Reconstruction algorithms, Optical alignment, Phase matching

Proceedings Article | 5 June 2001 Paper
Thomas Karnowski, Kenneth Tobin, Lloyd Arrowood, Regina Ferrell, James Goddard, Fred Lakhani
Proceedings Volume 4275, (2001) https://doi.org/10.1117/12.429362
KEYWORDS: Image retrieval, Databases, Semiconducting wafers, Photomasks, Semiconductors, Inspection, Image processing, Image classification, Visualization, Scanning electron microscopy

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