Lloyd F. Arrowood
at Y-12 National Security Complex
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 1 July 2010
JEI Vol. 19 Issue 3
KEYWORDS: Nondestructive evaluation, X-ray computed tomography, Computer simulations, Signal to noise ratio, Image registration, X-rays, Computed tomography, Reconstruction algorithms, Optical alignment, Phase matching

Proceedings Article | 5 June 2001
Proc. SPIE. 4275, Metrology-based Control for Micro-Manufacturing
KEYWORDS: Image retrieval, Databases, Semiconducting wafers, Photomasks, Semiconductors, Inspection, Image processing, Image classification, Visualization, Scanning electron microscopy

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