Dr. Lluis Pradell
at Univ Politècnica de Catalunya
SPIE Involvement:
Conference Co-Chair | Author | Editor
Publications (4)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Roentgenium, Calibration, Receivers, Diodes, Measurement devices, Field effect transistors, Avalanche photodiodes, Neodymium, Microwave radiation, Temperature metrology

SPIE Conference Volume | May 25, 2004

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Calibration, Error analysis, Gallium arsenide, Resistance, Receivers, Measurement devices, Bismuth, Microwave radiation, Instrument modeling, Received signal strength

PROCEEDINGS ARTICLE | January 24, 2004
Proc. SPIE. 5344, MEMS/MOEMS Components and Their Applications
KEYWORDS: Microelectromechanical systems, Actuators, Capacitors, Electrodes, Metals, Digital filtering, Photography, Manufacturing, Capacitance, Polysomnography

Conference Committee Involvement (1)
Noise in Communication
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
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