Loek Nijsten
at TNO
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 October 2019 Presentation + Paper
Proc. SPIE. 11166, Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies III
KEYWORDS: Target detection, Visualization, Sensors, Control systems, Surveillance, Surveillance systems, Probability theory, Fuzzy logic, Border security, Data fusion

Proceedings Article | 26 June 2017 Paper
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Wafer-level optics, Reticles, Metrology, Optical spheres, Defect detection, Speckle, Scanners, Particles, Silicon, Optical microscopy, Manufacturing, Inspection, Atomic force microscopy, Scanning electron microscopy, Latex, Semiconducting wafers, Signal detection, Particle contamination, Contamination control, Defect inspection

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