Louis-Séverin Bieri
at École Polytechnique Fédérale de Lausanne
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Cameras, Calibration, Error analysis, Control systems, LCDs, 3D metrology, Projection systems, Picosecond phenomena, 3D vision, Structured light

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top