Dr. Lu Tian Profile

Dr. Lu Tian

at Beijing Smart-Chip Microelectronics Technology Co

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Publications (1)

Proceedings Article | 5 November 2020 Paper

Failure mechanism of integrated circuits investigated experimentally and theoretically under electrical fast transient

Lu Tian, Yanbin Qiao, Haifeng Zhang, Yidong Yuan, Jin Shao

Proceedings Volume 11565, 115650J (2020) https://doi.org/10.1117/12.2576124

KEYWORDS: Failure analysis, Field effect transistors, High power microwaves, Integrated circuits, Electromagnetism, 3D modeling, Scanning electron microscopy, Electrical breakdown, System on a chip

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